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"Hot carrier reliability of RF N- LDMOS for S Band radar application."

M. Gares et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.074

access: closed

type: Journal Article

metadata version: 2022-10-02

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M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline:
Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectron. Reliab. 46(9-11): 1806-1811 (2006)

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