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"Electrical parameters degradation of power RF LDMOS device after ..."

Mohamed Ali Belaïd et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.073

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd, K. Ketata, Mohamed Masmoudi, M. Gares, Hichame Maanane, Jérôme Marcon:
Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. Microelectron. Reliab. 46(9-11): 1800-1805 (2006)

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