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2020 – today
- 2020
[c25]Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang:
Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency. ITC 2020: 1-4
2010 – 2019
- 2019
- [c24]Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy:
A supervised machine learning application in volume diagnosis. ETS 2019: 1-6 - 2018
- [c23]Tao Wang, Zhangchun Shi, Junlin Huang, Huaxing Tang, Wu Yang, Junna Zhong:
A case study for using dynamic partitioning based solution in volume diagnosis. DATE 2018: 1001-1002 - 2017
- [c22]Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng:
Scan Chain Diagnosis Based on Unsupervised Machine Learning. ATS 2017: 225-230 - [c21]Huaxing Tang, Arvind Jain, Sanil Kumark Pillai, Dharmesh Joshi, Shamitha Rao:
Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution for Cell Internal Defects. ATS 2017: 231-236 - 2016
- [c20]Peter C. Maxwell, Friedrich Hapke, Huaxing Tang:
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS 2016: 1-6 - 2015
- [c19]Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke:
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT 2015: 1-4 - 2014
- [j2]Jing Ye, Yu Hu, Xiaowei Li, Wu-Tung Cheng, Yu Huang, Huaxing Tang:
Diagnose Failures Caused by Multiple Locations at a Time. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 824-837 (2014) - [c18]Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma:
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS 2014: 318-323 - 2013
- [c17]Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy:
Distributed dynamic partitioning based diagnosis of scan chain. VTS 2013: 1-6 - 2012
- [j1]Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang:
Employing the STDF V4-2007 Standard for Scan Test Data Logging. IEEE Des. Test 29(6): 91-99 (2012) - [c16]Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware:
Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10 - 2011
- [c15]Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware:
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225 - [c14]Xun Tang, Wu-Tung Cheng, Ruifeng Guo
, Huaxing Tang, Sudhakar M. Reddy:
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. DFT 2011: 217-225 - [c13]Andras Kun, Ralf Arnold, Peter Heinrich, Gwenolé Maugard, Huaxing Tang, Wu-Tung Cheng:
Deterministic IDDQ diagnosis using a net activation based model. ITC 2011: 1-10
2000 – 2009
- 2008
- [c12]Chen Liu, Wu-Tung Cheng, Huaxing Tang, Sudhakar M. Reddy, Wei Zou, Manish Sharma:
Hyperactive Faults Dictionary to Increase Diagnosis Throughput. ATS 2008: 173-178 - [c11]Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9 - 2007
- [c10]Huaxing Tang, Chen Liu, Wu-Tung Cheng, Sudahkar M. Reddy, Wei Zou:
Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead. ATS 2007: 281-287 - [c9]Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware:
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS 2007: 145-150 - [c8]Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang:
Interconnect open defect diagnosis with minimal physical information. ITC 2007: 1-10 - [c7]Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang:
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. VTS 2007: 225-230 - 2006
- [c6]Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10 - [c5]Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang:
On Methods to Improve Location Based Logic Diagnosis. VLSI Design 2006: 181-187 - 2005
- [c4]Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz:
Defect Aware Test Patterns. DATE 2005: 450-455 - [c3]Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz:
On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios. VLSI Design 2005: 59-64 - 2003
- [c2]Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz:
On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs. ITC 2003: 1079-1088 - 2002
- [c1]Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita:
On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. ITC 2002: 83-89
Coauthor Index
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