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ORCIDFlorence Azaïs
- > Home > Persons > Florence Azaïs
Publications
- 2024
[c89]Stéphane Pitou, Florence Azaïs, Serge Bernard, Tristan Rouyer, Fabien Soulier, Vincent Kerzerho:
Low-Resource Fully-Digital BPSK Demodulation Technique for Intra-Body Wireless Sensor Networks. I2MTC 2024: 1-6- 2023
- [j45]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023) - 2021
- [j44]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37(2): 225-242 (2021) - [c82]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre:
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS 2021: 1-7 - 2020
- [j42]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36(2): 189-203 (2020) - [c80]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea
, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - [c79]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6 - 2019
- [c77]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS 2019: 1-6 - [c76]Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre:
Which metrics to use for RF indirect test strategy? SMACD 2019: 73-76 - 2018
- [j40]Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard:
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34(3): 281-290 (2018) - 2015
- [j35]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46(11): 1091-1102 (2015) - [c66]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI 2015: 621-626 - [c65]Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard:
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI 2015: 634-639 - 2014
- [j32]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45(3): 336-344 (2014) - [c62]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE 2014: 1-4 - [c61]Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos:
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - [c59]Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell:
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW 2014: 1-6 - 2013
- [j31]Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell:
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44(9): 840-843 (2013) - [c56]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Implementing model redundancy in predictive alternate test to improve test confidence. ETS 2013: 1 - [c54]Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti:
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS 2013: 1-4 - 2012
- [c53]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Making predictive analog/RF alternate test strategy independent of training set size. ITC 2012: 1-9 - [c50]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma:
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24 - 2011
- [j29]Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell:
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27(3): 335-350 (2011) - 2009
- [c43]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD 2009: 747-750 - 2008
- [j25]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib:
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008) - 2007
- [j24]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007) - [c39]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2007: 211-216 - 2006
- [j23]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006) - [c38]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2006: 159-164 - 2005
- [j18]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electron. Test. 21(3): 291-298 (2005) - 2004
- [j14]Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell:
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electron. Test. 20(3): 257-267 (2004) - [j13]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electron. Test. 20(4): 375-387 (2004) - 2003
- [j8]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electron. Test. 19(4): 469-479 (2003) - [j7]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
A-to-D converters static error detection from dynamic parameter measurement. Microelectron. J. 34(10): 945-953 (2003) - [c29]Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell:
A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209 - 2002
- [c28]Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival:
European Network for Test Education. DELTA 2002: 230-234 - [c26]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
A high accuracy triangle-wave signal generator for on-chip ADC testing. ETW 2002: 89-94 - [c25]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski:
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW 2002: 174-179 - 2001
- [j5]Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electron. Test. 17(2): 139-147 (2001) - [j4]Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electron. Test. 17(3-4): 255-266 (2001) - [c24]Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595 - [c23]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
Analog BIST Generator for ADC Testing. DFT 2001: 338-346 - [c22]Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436 - [c21]Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand:
Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048 - [c20]Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell:
On-Chip Generation of High-Quality Ramp Stimulus With Minimal Silicon Area. LATW 2001: 112-117 - [c18]Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell:
A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271 - 2000
- [c15]Florence Azaïs, Serge Bernard, Y. Betrand, Michel Renovell:
Towards an ADC BIST scheme using the histogram test technique. ETW 2000: 53-58 - [c13]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
Minimizing the Hardware Overhead of a Histogram-Based BIST Scheme for Analog-to-Digital Converters. LATW 2000: 118-122 - [c12]Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand:
Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254
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