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"Development and Application of Embedded Test Instruments to Digital, ..."

Florence Azaïs et al. (2020)

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DOI: 10.1109/IOLTS50870.2020.9159723

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/iolts/AzaisBCDDBF0KLL20
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/AzaisBCDDBF0KLL20
Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4

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