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"On the Use of the Indirect Test Strategy for Lifetime Performance ..."

Hassan El Badawi et al. (2023)

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DOI: 10.1007/S10836-023-06058-7

access: closed

type: Journal Article

metadata version: 2023-07-07

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  - https://dblp.org/rec/journals/et/BadawiABCKL23
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023)

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