Volume 9, Number 1, January 1990
Volume 9, Number 2, February 1990
, Mark Horowitz
: Techniques for calculating currents and voltages in VLSI power supply networks.
Volume 9, Number 3, March 1990
Niraj K. Jha
: Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuits.
Volume 9, Number 4, April 1990
: Multilevel verification of MOS circuits.
, F. Arakawa
: An analysis of the aliasing probability of multiple-input signature registers in the case of a 2m-ary symmetric channel.
Volume 9, Number 5, May 1990
: Constrained via minimization for systolic arrays.
, Ulrich Weinert
: A simulation system for diffusive oxidation of silicon: a two-dimensional finite element approach.
Volume 9, Number 6, June 1990
Bulent I. Dervisoglu
: Application of scan hardware and software for debug and diagnostics in a workstation environment.
Joel W. Gannett
: SHORTFINDER: a graphical CAD tool for locating net-to-net shorts in VLSI chip layouts.
Volume 9, Number 7, July 1990
Volume 9, Number 8, August 1990
, Magdy A. Bayoumi
: Systolic temporal arithmetic: a new formalism for specification and verification of systolic arrays.
Yu Hen Hu
, Sao-Jie Chen
: GM Plan: a gate matrix layout algorithm based on artificial intelligence planning techniques.
Volume 9, Number 9, September 1990
Resve A. Saleh
, Jacob K. White
: Accelerating relaxation algorithms for circuit simulation using waveform-Newton and step-size refinement.
, A. Richard Newton
: A circuit disassembly technique for synthesizing symbolic layouts from mask descriptions.
, Ming-Chuen Shiau
: Efficient physical timing models for CMOS AND-OR-inverter and OR-AND-inverter gates and their applications.
Volume 9, Number 10, October 1990
: Parallel global routing for standard cells.
Volume 9, Number 11, November 1990
: Three-dimensional nonequilibrium interface conditions for electron transport at band edge discontinuities.
Gerhard K. M. Wachutka
: Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling.
: The Monte Carlo method for semiconductor device and process modeling.
: Fourier method modeling of semiconductor devices.
Volume 9, Number 12, December 1990