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"Probabilistic simulation for reliability analysis of CMOS VLSI circuits."

Farid N. Najm et al. (1990)

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DOI: 10.1109/43.45875

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/NajmBYH90
Farid N. Najm, Richard Burch, Ping Yang, Ibrahim N. Hajj:
Probabilistic simulation for reliability analysis of CMOS VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(4): 439-450 (1990)

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