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"DYTEST: a self-learning algorithm using dynamic testability measures to ..."

Weiwei Mao, Michael D. Ciletti (1990)

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DOI: 10.1109/43.57782

access: closed

type: Journal Article

metadata version: 2020-09-24

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Weiwei Mao, Michael D. Ciletti:
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(8): 893-898 (1990)

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