Volume 25, Number 1, January/February 2008
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journals/dt/JoannonBRTC08
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journals/dt/KranitisMTPG08
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Volume 25, Number 2, March/April 2008
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journals/dt/SrinivasanTC08
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journals/dt/HashempourL08
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Volume 25, Number 3, May/June 2008
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Bart Vermeulen :
Functional Debug Techniques for Embedded Systems.
208-215
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journals/dt/KillpackNKB08
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journals/dt/VermeulenSKSR08
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Grant Martin :
Learning to assert yourself [review of Creating Assertion-Based IP (H.D. Foster and A.C. Krolnik; 2008)].
284-285
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Volume 25, Number 4, July/August 2008
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journals/dt/Amerasekera08
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journals/dt/ShanbhagMVOMRJR08
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Leon Stok :
Variability and New Design Paradigms.
344
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journals/dt/Sangiovanni-Vincentelli08
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John C. Zolper :
The GSRC's Role in Meeting Tomorrow's Design Challenges.
366-367
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Betsy Weitzman :
Who knew this "experiment" would be so successful?
392
Volume 25, Number 5, September/October 2008
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journals/dt/KuhnleHBDMRCPLMDC08 Matthias Kühnle ,
Michael Hübner ,
Jürgen Becker ,
Antonio Deledda ,
Claudio Mucci ,
Florian Ries ,
Marcello Coppola ,
Lorenzo Pieralisi ,
Riccardo Locatelli ,
Giuseppe Maruccia ,
Tommaso DeMarco ,
Fabio Campi :
An Interconnect Strategy for a Heterogeneous, Reconfigurable SoC.
442-451
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journals/dt/SemiaoRRPVSTT08
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Giovanni De Micheli :
Designing Micro- and Nanosystems for a Safer and Healthier Tomorrow.
488-494
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journals/dt/Sapatnekar08a Sachin S. Sapatnekar :
Adapting to the times [review of Adaptive Techniques for Dynamic Processor Optimization: Theory and Practice (Wang, A. and Naffziger, S., Eds.; 2008)].
496-497
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Volume 25, Number 6, November/December 2008
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journals/dt/BergamaschiBFKSW08
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William R. Mann :
Wafer Test Methods to Improve Semiconductor Die Reliability.
528-537
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journals/dt/TehranipoorR08
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journals/dt/SheibanyradGP08
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journals/dt/GheorghitaBC08
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journals/dt/HuffmireBSKLNI08
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Grant Martin :
The two faces of high-level synthesis [review of High-Level Synthesis: From Algorithm to Digital Circuit (Coussy, P. and Morawiec, A., Eds., 2008)].
600-601
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