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"Characterization of Equalized and Repeated Interconnects for NoC Applications."

Byungsub Kim, Vladimir Stojanovic (2008)

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DOI: 10.1109/MDT.2008.137

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/KimS08
Byungsub Kim, Vladimir Stojanovic:
Characterization of Equalized and Repeated Interconnects for NoC Applications. IEEE Des. Test Comput. 25(5): 430-439 (2008)

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