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"Wafer Test Methods to Improve Semiconductor Die Reliability."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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William R. Mann (2008)

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Dagstuhl

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DOI: 10.1109/MDT.2008.174

access: closed

type: Journal Article

metadata version: 2020-05-17

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William R. Mann:
Wafer Test Methods to Improve Semiconductor Die Reliability. IEEE Des. Test Comput. 25(6): 528-537 (2008)

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last updated on 2020-05-17 11:44 CEST by the dblp team

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