ITC 2009:
Austin, TX, USAGordon W. Roberts , Bill Eklow (Eds.):
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009.
IEEE 2009, ISBN 978-1-4244-4868-5
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
conf/itc/Devta-PrasannaGGWK09 export record as
dblp key:
conf/itc/ChakravadhanulaCKGN09 export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Xiao Liu ,
Qiang Xu :
On simultaneous shift- and capture-power reduction in linear decompressor-based test compression environment.
1-10
export record as
dblp key:
Albert Yeh ,
Jesse Chou ,
Max Lin :
An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits.
1-9
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Hideo Okawara :
SSC applied serial ATA signal generation and analysis by analog tester resources.
1-9
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Min Li ,
Michael S. Hsiao :
An ant colony optimization technique for abstraction-guided state justification.
1-10
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Adam W. Ley :
Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture.
1-10
export record as
dblp key:
Len Losik :
Eliminating product infant mortality failures using prognostic analysis.
1
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Heiko Ehrenberg :
Test Mode Entry and Exit Methods for IEEE P1581 compliant devices.
1
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
conf/itc/Aldrete-VidrioOAMS09 export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
export record as
dblp key:
Xiao Liu ,
Qiang Xu :
Trace signal selection for debugging electrical errors in post-silicon validation.
1
export record as
dblp key:
Adam W. Ley :
Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?
1
export record as
dblp key:
export record as
dblp key:
Matthias Kamm :
Manufacturing data: Maximizing value using component-to-system analysis.
1
export record as
dblp key:
export record as
dblp key:
data released under the ODC-BY 1.0 license
