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"On-chip power supply noise measurement using Time Resolved Emission (TRE) ..."

Franco Stellari et al. (2009)

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DOI: 10.1109/TEST.2009.5355543

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza:
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC 2009: 1-10

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