6. Asian Test Symposium 1997: Akita, Japan

Keynote Address

Test Generation I

Design for Testability I

Test Generation II

Fault Tolerance

Case Studies for DFT Techniques in Japanese Industry

Test Technologies

Beam Testing of VLSI Circuits in Japan

Mixed-Signal Test

Novel Beam Testing Techniques in Japan

Decision Diagrams and Logic Optimization


Software Test


Design for Testability II

Delay Test

Built-in Self-Test I

Current Testing

Built-in Self-Test II