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Publication search results
found 39 matches
- 2017
- Babak Aghaei
:
A high fault coverage test approach for communication channels in network on chip. Microelectron. Reliab. 75: 178-186 (2017) - Xuezong Bai, Zongwen An, Yunfeng Hou, Qiang Ma
:
Health assessment and management of wind turbine blade based on the fatigue test data. Microelectron. Reliab. 75: 205-214 (2017) - Zhiqiang Chen
, Shengcai Deng, Xudong Chen, Chuan Li
, René-Vinicio Sánchez
, Huafeng Qin:
Deep neural networks-based rolling bearing fault diagnosis. Microelectron. Reliab. 75: 327-333 (2017) - Yunxia Chen, Yi Jin, Rui Kang:
Coupling damage and reliability modeling for creep and fatigue of solder joint. Microelectron. Reliab. 75: 233-238 (2017) - Zhen Chen, Yang Peng, Hao Cheng, Zizhou Yang, Mingxiang Chen:
Void-free and high-speed filling of through ceramic holes by copper electroplating. Microelectron. Reliab. 75: 171-177 (2017) - Liangbiao Chen, Jiang Zhou
, Hsing-wei Chu, Guoqi Zhang, Xuejun Fan
:
Modeling nonlinear moisture diffusion in inhomogeneous media. Microelectron. Reliab. 75: 162-170 (2017) - Shunfeng Cheng, Chien-Ming Huang, Michael G. Pecht:
A review of lead-free solders for electronics applications. Microelectron. Reliab. 75: 77-95 (2017) - Kunmo Chu, Changseung Lee, Sung-Hoon Park
, Yoonchul Sohn:
Effects of Ag addition and Ag3Sn formation on the mechanical reliability of Ni/Sn solder joints. Microelectron. Reliab. 75: 53-58 (2017) - Federico Giacci, Stefano Dellea, Giacomo Langfelder
:
Signal integrity in capacitive and piezoresistive single- and multi-axis MEMS gyroscopes under vibrations. Microelectron. Reliab. 75: 59-68 (2017) - Wei Guo, Zheming Zhou, Cheng Chen, Xiang Li:
Multi-frequency weak signal detection based on multi-segment cascaded stochastic resonance for rolling bearings. Microelectron. Reliab. 75: 239-252 (2017) - A. E. Hammad
, A. A. Ibrahiem:
Enhancing the microstructure and tensile creep resistance of Sn-3.0Ag-0.5Cu solder alloy by reinforcing nano-sized ZnO particles. Microelectron. Reliab. 75: 187-194 (2017) - Minru Hao, Huiyong Hu, Chen-Guang Liao, Bin Wang, Haiyan Kang, He-Ming Zhang:
Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET. Microelectron. Reliab. 75: 69-76 (2017) - Isaí Hernández, César Adrián Pons-Flores
, Ivan Garduño, Julio C. Tinoco, Israel Mejia
, Magali Estrada:
Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. Microelectron. Reliab. 75: 9-13 (2017) - Slah Hlali
, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi:
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectron. Reliab. 75: 154-161 (2017) - L. Hua, H. N. Hou:
Electrochemical corrosion and electrochemical migration of 64Sn-35Bi-1Ag solder doping with xGe on printed circuit boards. Microelectron. Reliab. 75: 27-36 (2017) - Kamil Janeczek:
Reliability analysis of UHF RFID tags under long-term mechanical cycling. Microelectron. Reliab. 75: 96-101 (2017) - J.-H. Jeong, J.-H. Kim, Chung-Seog Oh
:
Quantitative evaluation of bending reliability for a flexible near-field communication tag. Microelectron. Reliab. 75: 121-126 (2017) - Xiaoxuan Jiao, Bo Jing, Yifeng Huang, Juan Li, Guangyue Xu:
Research on fault diagnosis of airborne fuel pump based on EMD and probabilistic neural networks. Microelectron. Reliab. 75: 296-308 (2017) - Xiaoyang Li
, Yue Liu, Rui Kang, Lianghua Xiao:
Service reliability modeling and evaluation of active-active cloud data center based on the IT infrastructure. Microelectron. Reliab. 75: 271-282 (2017) - Liansheng Liu, Shaojun Wang, Datong Liu, Yu Peng:
Quantitative selection of sensor data based on improved permutation entropy for system remaining useful life prediction. Microelectron. Reliab. 75: 264-270 (2017) - Zhixing Lv
, Nan Yan, Bingliang Bao:
Pin-pin ESD protection for electro-explosive device under severe human body ESD. Microelectron. Reliab. 75: 37-42 (2017) - Qiang Miao, Datong Liu:
Recent progress on electro-mechanical system prognostics and health management. Microelectron. Reliab. 75: 195-196 (2017) - Qiang Miao
, Xin Zhang, Zhiwen Liu, Heng Zhang:
Condition multi-classification and evaluation of system degradation process using an improved support vector machine. Microelectron. Reliab. 75: 223-232 (2017) - Gang Niu
, Hao Li:
IETM centered intelligent maintenance system integrating fuzzy semantic inference and data fusion. Microelectron. Reliab. 75: 197-204 (2017) - Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei:
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs. Microelectron. Reliab. 75: 135-141 (2017) - Thomas Santini, Sébastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall
, Bruno Allard:
Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. Microelectron. Reliab. 75: 14-19 (2017) - Yuchen Song, Datong Liu, Chen Yang, Yu Peng:
Data-driven hybrid remaining useful life estimation approach for spacecraft lithium-ion battery. Microelectron. Reliab. 75: 142-153 (2017) - Yun-Na Sun
, Dongwoo Kang, Yazhou Zhang, Jiangbo Luo, Yanmei Liu, Yan Wang, Guifu Ding:
Plastic analysis for through silicon via with actual etching defect of triangular-teeth and scallops. Microelectron. Reliab. 75: 43-52 (2017) - Anees Ullah
, Ernesto Sánchez, Luca Sterpone
, Luis Andrés Cardona, Carles Ferrer:
An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs. Microelectron. Reliab. 75: 110-120 (2017) - Dong Wang
, Fangfang Yang, Yang Zhao, Kwok-Leung Tsui:
Prognostics of Lithium-ion batteries based on state space modeling with heterogeneous noise variances. Microelectron. Reliab. 75: 1-8 (2017)
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