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Vitaly Ocheretny : Self-checking arithmetic logic unit with duplicated outputs. IOLTS 2010 : 202-203 share record
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Vladimir Pasca , Lorena Anghel , Claudia Rusu , Mounir Benabdenbi : Configurable serial fault-tolerant link for communication in 3D integrated systems. IOLTS 2010 : 115-120 share record
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Michel Pignol , Florence Malou , Corinne Aicardi : Qualification and relifing testing for space applications applied to the agilent G-Link components. IOLTS 2010 : 103-108 share record
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Irith Pomeranz , Sudhakar M. Reddy : Selecting state variables for improved on-line testability through output response comparison of identical circuits. IOLTS 2010 : 179-184 share record
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V. Prasanth , Virendra Singh , Rubin A. Parekhji : Robust detection of soft errors using delayed capture methodology. IOLTS 2010 : 277-282 share record
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Paolo Rech , Michelangelo Grosso , Fabio Melchiori , Domenico Loparco , Davide Appello , Luigi Dilillo , Alessandro Paccagnella , Matteo Sonza Reorda : Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010 : 29-34 share record
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A. Richardson : Concepts for fault tolerant sensor systems. IOLTS 2010 : 137 share record
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Josep Rius : A method for detecting resistive opens in buses. IOLTS 2010 : 187-189 share record
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Martin Rozkovec , Jiri Jenícek , Ondrej Novák : Application dependent FPGA testing method using compressed deterministic test vectors. IOLTS 2010 : 192-193 share record
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Claudia Rusu , Lorena Anghel , Dimiter Avresky : RILM: Reconfigurable inter-layer routing mechanism for 3D multi-layer networks-on-chip. IOLTS 2010 : 121-126 share record
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Ali Shahabi , S. Behdad Hosseini , Hasan Sohofi , Zainalabedin Navabi : A partitioning approach to improve reconfigurable neuron-inspired online BIST. IOLTS 2010 : 173-178 share record
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Michael N. Skoufis , Spyros Tragoudas : On-line detection of random voltage perturbations in buses with multiple-threshold receivers. IOLTS 2010 : 249-254 share record
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Steffen Tarnick : Design of embedded constant weight code checkers based on averaging operations. IOLTS 2010 : 255-260 export record
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conf/iolts/TheodorouKPG10 share record
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George Theodorou , Nektarios Kranitis , Antonis M. Paschalis , Dimitris Gizopoulos : A software-based self-test methodology for in-system testing of processor cache tag arrays. IOLTS 2010 : 159-164 share record
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Stefanos Valadimas , Yiorgos Tsiatouhas , Angela Arapoyanni : Timing error tolerance in nanometer ICs. IOLTS 2010 : 283-288 share record
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Anna Vaskova , Celia López-Ongil , Alejandro Jiménez-Horas , Enrique San Millán , Luis Entrena : Robust cryptographic ciphers with on-line statistical properties validation. IOLTS 2010 : 208-210 export record
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conf/iolts/VazquezCZRSTST10 share record
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Julio César Vázquez , Víctor H. Champac , Adriel Ziesemer , Ricardo Reis , Jorge Semião , Isabel C. Teixeira , Marcelino B. Santos , João Paulo Teixeira : Predictive error detection by on-line aging monitoring. IOLTS 2010 : 9-14 share record
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Zhen Wang , Mark G. Karpovsky : Robust FSMs for cryptographic devices resilient to strong fault injection attacks. IOLTS 2010 : 240-245 share record
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Long Wang , Zbigniew Kalbarczyk , Ravishankar K. Iyer , Arun Iyengar : Checkpointing virtual machines against transient errors. IOLTS 2010 : 97-102 share record
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Joshua W. Wells , Jayaram Natarajan , Abhijit Chatterjee : Error resilient video encoding using Block-Frame Checksums. IOLTS 2010 : 289-294 share record
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Hyunbean Yi , Tomokazu Yoneda , Michiko Inoue , Yasuo Sato , Seiji Kajihara , Hideo Fujiwara : Aging test strategy and adaptive test scheduling for SoC failure prediction. IOLTS 2010 : 21-26 share record
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Steffen Zeidler , Alexandre V. Bystrov , Milos Krstic , Rolf Kraemer : On-line testing of bundled-data asynchronous handshake protocols. IOLTS 2010 : 261-267 share record
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Zhen Zhang , Alain Greiner , Mounir Benabdenbi : Fully distributed initialization procedure for a 2D-Mesh NoC, including off-line BIST and partial deactivation of faulty components. IOLTS 2010 : 194-196 share record
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Yervant Zorian : Test and reliability concerns for 3D-ICs. IOLTS 2010 : 219 share record
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16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. IEEE Computer Society 2010 , ISBN 978-1-4244-7724-1 [contents]