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2010 – 2019
- 2011
[j9]Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick:
An Accumulator - Based Test-Per-Clock Scheme. IEEE Trans. Very Large Scale Integr. Syst. 19(6): 1090-1094 (2011)- 2010
- [c12]Steffen Tarnick:
Design of embedded constant weight code checkers based on averaging operations. IOLTS 2010: 255-260
2000 – 2009
- 2008
- [j8]Steffen Tarnick:
Self-Testing Embedded Borden t -UED Code Checkers for t = 2 k q - 1 with q = 2 m - 1. J. Electron. Test. 24(6): 509-527 (2008) - [c11]Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick:
A Low-Cost Accumulator-Based Test Pattern Generation Architecture. IOLTS 2008: 267-272 - 2007
- [c10]Steffen Tarnick:
Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters. IOLTS 2007: 285-292 - 2006
- [c9]Steffen Tarnick:
Embedded Borden 2-UED Code Checkers. IOLTS 2006: 173-175 - 2005
- [j7]Steffen Tarnick:
Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes. J. Electron. Test. 21(4): 391-404 (2005) - 2004
- [j6]Steffen Tarnick:
Design of Embedded Self-Testing Checkers for t-UED and BUED Codes. J. Electron. Test. 20(5): 465-477 (2004) - [c8]Steffen Tarnick:
Single-Output Embedded Checkers for Systematic Unordered Codes. IOLTS 2004: 45-51 - 2003
- [c7]Steffen Tarnick:
Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes. DATE 2003: 11162-11163 - [c6]Steffen Tarnick:
A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers. IOLTS 2003: 43-48 - 2000
- [j5]Albrecht P. Stroele, Steffen Tarnick:
Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes. J. Electron. Test. 16(4): 355-367 (2000)
1990 – 1999
- 1999
- [c5]Albrecht P. Stroele, Steffen Tarnick:
Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code. VTS 1999: 361-369 - 1998
- [j4]Steffen Tarnick:
Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability. VLSI Design 5(4): 347-356 (1998) - [c4]Steffen Tarnick, Albrecht P. Stroele:
Embedded self-testing checkers for low-cost arithmetic codes. ITC 1998: 514-523 - 1996
- [j3]Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick:
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996) - 1995
- [b1]Steffen Tarnick:
Data compression techniques for concurrent error detection and built-in self test. University of Potsdam, Germany, 1995, pp. 1-159 - [j2]Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois:
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995) - [j1]Steffen Tarnick:
Controllable self-checking checkers for conditional concurrent checking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 547-553 (1995) - [c3]Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich:
Pattern generation for a deterministic BIST scheme. ICCAD 1995: 88-94 - 1994
- [c2]Steffen Tarnick:
Controllable self-checking checkers for conditional concurrent checking. VTS 1994: 144-150 - 1992
- [c1]Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski:
Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
Coauthor Index
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