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Fred J. Meyer
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Journal Articles
- 2006
- [j27]Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer:
Measuring the timing jitter of ATE in the frequency domain. IEEE Trans. Instrum. Meas. 55(1): 280-289 (2006) - [j26]Marco Ottavi
, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi:
Evaluating the Yield of Repairable SRAMs for ATE. IEEE Trans. Instrum. Meas. 55(5): 1704-1712 (2006) - 2005
- [j25]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. 54(5): 1770-1778 (2005) - 2004
- [j24]Cristiana Bolchini
, Fred J. Meyer:
Guest editorial. J. Syst. Archit. 50(5): 237-238 (2004) - [j23]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans. Instrum. Meas. 53(2): 300-307 (2004) - [j22]Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi:
Sequential diagnosis of processor array systems. IEEE Trans. Reliab. 53(4): 487-498 (2004) - 2003
- [j21]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi:
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers 52(10): 1259-1270 (2003) - [j20]Fred J. Meyer, Nohpill Park:
Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers 52(11): 1470-1479 (2003) - [j19]Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max:
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. 52(6): 1749-1755 (2003) - [j18]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park:
Maximal diagnosis of interconnects of random access memories. IEEE Trans. Reliab. 52(4): 423-434 (2003) - 2002
- [j17]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Des. Test Comput. 19(1): 54-64 (2002) - [j16]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
Quality-effective repair of multichip module systems. J. Syst. Archit. 47(10): 883-900 (2002) - 2000
- [j15]Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers 49(1): 48-54 (2000) - [j14]Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
Testing and testable designs for one-time programmable FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(11): 1370-1375 (2000) - 1999
- [j13]Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer:
Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Des. Test Comput. 16(1): 19-21 (1999) - [j12]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
Design Verification of FPGA Implementations. IEEE Des. Test Comput. 16(2): 66-73 (1999) - [j11]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electron. Test. 15(1-2): 157-171 (1999) - [j10]Xiao-Tao Chen, Wenyi Feng, Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Reconfiguring one-time programmable FPGAs. IEEE Micro 19(6): 53-63 (1999) - [j9]Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi:
Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. Very Large Scale Integr. Syst. 7(1): 48-55 (1999) - 1998
- [j8]Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi:
Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. 3(2): 249-271 (1998) - [j7]Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi:
Testing configurable LUT-based FPGA's. IEEE Trans. Very Large Scale Integr. Syst. 6(2): 276-283 (1998) - 1993
- [j6]Dhiraj K. Pradhan, Fred J. Meyer:
Communication structures in fault-tolerant distributed systems. Networks 23(4): 379-389 (1993) - [j5]D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan:
Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 546-558 (1993) - 1991
- [j4]Fred J. Meyer, Dhiraj K. Pradhan:
Consensus With Dual Failure Modes. IEEE Trans. Parallel Distributed Syst. 2(2): 214-222 (1991) - 1989
- [j3]Fred J. Meyer, Dhiraj K. Pradhan:
Dynamic Testing Strategy for Distributed Systems. IEEE Trans. Computers 38(3): 356-365 (1989) - [j2]Fred J. Meyer, Dhiraj K. Pradhan:
Modeling Defect Spatial Distribution. IEEE Trans. Computers 38(4): 538-546 (1989) - 1988
- [j1]Fred J. Meyer, Dhiraj K. Pradhan:
Flip-Trees: Fault-Tolerant Graphs with Wide Containers. IEEE Trans. Computers 37(4): 472-478 (1988)
Conference and Workshop Papers
- 2005
- [c29]Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer:
QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228 - 2004
- [c28]Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi:
On The Yield of Compiler-Based eSRAMs. DFT 2004: 11-19 - [c27]Tao Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer:
Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT 2004: 442-450 - [c26]Marco Ottavi
, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi:
Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI 2004: 136-140 - 2003
- [c25]Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson:
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT 2003: 159-166 - [c24]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi:
Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936 - 2002
- [c23]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194 - [c22]Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi:
Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108 - 2001
- [c21]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT 2001: 161-169 - [c20]Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26 - 2000
- [c19]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi:
Quality-Effective Repair of Multichip Module Systems. DFT 2000: 47-55 - [c18]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi:
Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops 2000: 951-958 - [c17]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT 2000: 14-19 - 1999
- [c16]Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium 1999: 95-100 - [c15]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi:
Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT 1999: 112-120 - [c14]Fred J. Meyer, Fabrizio Lombardi, Jun Zhao:
Good Processor Identification in Two-Dimensional Grids. DFT 1999: 348-356 - [c13]Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi:
Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT 1999: 368-376 - [c12]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi:
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS 1999: 130-137 - [c11]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT 1999: 40-47 - [c10]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Maximal Diagnosis of Interconnects of Random Access Memories. VTS 1999: 378-383 - 1998
- [c9]Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
Fault Detection in a Tristate System Environment. Asian Test Symposium 1998: 253-258 - [c8]Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi:
A New Method for Testing EEPLA's. DFT 1998: 146-154 - [c7]Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi:
On the Complexity of Sequential Testing in Configurable FPGAs. DFT 1998: 164- - [c6]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS 1998: 42-47 - 1997
- [c5]Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi:
A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium 1997: 248-253 - [c4]David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi:
Testing of programmable logic devices (PLD) with faulty resources. DFT 1997: 76-84 - [c3]Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi:
Multiple fault detection in logic resources of FPGAs. DFT 1997: 186-194 - [c2]Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi:
Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS 1997: 216-225 - [c1]Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi:
On the Fault Coverage of Interconnect Diagnosis. VTS 1997: 101-109
Coauthor Index
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