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"Analysis and measurement of timing jitter induced by radiated EMI noise in ..."

Young-Jun Lee et al. (2003)

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DOI: 10.1109/TIM.2003.818727

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/LeeKLSKMLM03
Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max:
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. 52(6): 1749-1755 (2003)

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