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ORCIDAlodeep Sanyal
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Journal Articles
- 2012
[j6]Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays. IEEE Trans. Computers 61(7): 986-998 (2012)- [j5]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. Very Large Scale Integr. Syst. 20(3): 424-436 (2012) - 2010
- [j4]Alodeep Sanyal, Syed M. Alam, Sandip Kundu:
BIST to Detect and Characterize Transient and Parametric Failures. IEEE Des. Test Comput. 27(5): 50-59 (2010) - [j3]Alodeep Sanyal, Ashesh Rastogi, Wei Chen, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects. IEEE Trans. Computers 59(7): 922-932 (2010) - 2009
- [j2]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
An Improved Soft-Error Rate Measurement Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 596-600 (2009) - 2008
- [j1]Ashesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
On Composite Leakage Current Maximization. J. Electron. Test. 24(4): 405-420 (2008)
Conference and Workshop Papers
- 2017
- [c16]Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz:
DFM-aware fault model and ATPG for intra-cell and inter-cell defects. ITC 2017: 1-10 - 2014
- [c15]Alodeep Sanyal, Yanjing Li:
Special session 11C: Young professionals in test - Elevator talks. VTS 2014: 1 - [c14]Alodeep Sanyal, Yanjing Li, Yervant Zorian:
Special session 12C: Young professionals in test - Town meeting. VTS 2014: 1 - 2013
- [c13]Alodeep Sanyal, Yervant Zorian:
Special session 12C: Town-hall meeting "young professionals in test". VTS 2013: 1 - 2010
- [c12]Alodeep Sanyal, Krishnendu Chakrabarty
, Mahmut Yilmaz, Hideo Fujiwara:
RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. ITC 2010: 625-634 - 2009
- [c11]Alodeep Sanyal, Abhisek Pan, Sandip Kundu:
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits. ACM Great Lakes Symposium on VLSI 2009: 529-534 - [c10]Alodeep Sanyal, Abhisek Pan, Sandip Kundu:
A study on impact of loading effect on capacitive crosstalk noise. ISQED 2009: 696-701 - 2008
- [c9]Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu:
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. DATE 2008: 616-621 - [c8]Alodeep Sanyal, Syed M. Alam, Sandip Kundu:
A Built-In Self-Test Scheme for Soft Error Rate Characterization. IOLTS 2008: 65-70 - [c7]Alodeep Sanyal, Sandip Kundu:
A Built-in Test and Characterization Method for Circuit Marginality Related Failures. ISQED 2008: 838-843 - 2007
- [c6]Alodeep Sanyal, Sandip Kundu:
On Derating Soft Error Probability Based on Strength Filtering. IOLTS 2007: 152-160 - [c5]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection. IOLTS 2007: 191-193 - [c4]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
On Accelerating Soft-Error Detection by Targeted Pattern Generation. ISQED 2007: 723-728 - [c3]Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect. VLSI Design 2007: 583-588 - 2006
- [c2]Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
A Pattern Generation Technique for Maximizing Power Supply Currents. ICCD 2006: 338-343 - 2005
- [c1]Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya:
Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095
Coauthor Index
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