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2010 – 2019
- 2015
[j48]Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55(9-10): 1916-1919 (2015)- 2014
- [j47]Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet
, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54(9-10): 2088-2092 (2014) - 2013
- [j46]Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis:
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53(9-11): 1315-1319 (2013) - [j45]I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu:
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53(9-11): 1325-1328 (2013) - 2012
- [j44]R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis:
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52(9-10): 1816-1821 (2012) - [j43]Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis:
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52(9-10): 2035-2038 (2012) - [j42]Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis:
High performance thermography with InGaAs photon counting camera. Microelectron. Reliab. 52(9-10): 2087-2092 (2012) - 2011
- [j41]Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis:
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectron. Reliab. 51(9-11): 1640-1645 (2011) - [j40]Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis:
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51(9-11): 1658-1661 (2011) - [j39]Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet:
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51(9-11): 1662-1667 (2011) - [j38]Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis:
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectron. Reliab. 51(9-11): 1684-1688 (2011) - 2010
- [j37]A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis:
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50(9-11): 1236-1240 (2010) - [j36]Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet:
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50(9-11): 1499-1505 (2010) - [j35]Fulvio Infante, Philippe Perdu, Dean Lewis:
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectron. Reliab. 50(9-11): 1700-1705 (2010)
2000 – 2009
- 2009
- [j34]Dean Lewis, Nathalie Labat:
Editorial. Microelectron. Reliab. 49(9-11): 935-936 (2009) - [j33]C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart:
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49(9-11): 1143-1147 (2009) - [j32]Fulvio Infante, Philippe Perdu, Dean Lewis:
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectron. Reliab. 49(9-11): 1169-1174 (2009) - [j31]Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget:
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49(9-11): 1175-1181 (2009) - 2008
- [j30]Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely:
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48(8-9): 1333-1338 (2008) - [j29]Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis:
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48(8-9): 1529-1532 (2008) - [j28]Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier:
Generic simulator for faulty IC. Microelectron. Reliab. 48(8-9): 1592-1596 (2008) - [c6]Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco:
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS 2008: 295-301 - 2007
- [c5]Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis:
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993 - 2006
- [j27]Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46(9-11): 1514-1519 (2006) - [j26]Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis:
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46(9-11): 1563-1568 (2006) - 2005
- [j25]Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45(9-11): 1415-1420 (2005) - [j24]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j23]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45(9-11): 1465-1470 (2005) - [j22]Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit:
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45(9-11): 1476-1481 (2005) - [c4]Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13 - 2004
- [j21]Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis:
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44(9-11): 1655-1662 (2004) - [j20]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44(9-11): 1675-1680 (2004) - [j19]Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis:
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44(9-11): 1709-1714 (2004) - [j18]Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis:
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44(9-11): 1715-1720 (2004) - [j17]Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis:
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44(9-11): 1811-1815 (2004) - [j16]Vincent Pouget, Dean Lewis, Pascal Fouillat:
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53(4): 1227-1231 (2004) - 2003
- [j15]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j14]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j13]Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003) - [j12]Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43(9-11): 1577-1582 (2003) - [j11]Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis:
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43(9-11): 1639-1644 (2003) - [j10]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - [j9]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - 2002
- [j8]Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement:
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42(9-11): 1581-1585 (2002) - [j7]Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002) - [j6]Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002) - [c3]Dean Lewis, Pascal Fouillat, Vincent Pouget:
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW 2002: 109-113 - 2001
- [j5]Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001) - [j4]Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis:
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1477-1482 (2001) - [j3]Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner:
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41(9-10): 1513-1518 (2001) - [j2]Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1539-1544 (2001) - [j1]Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis:
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41(9-10): 1557-1561 (2001) - [c2]Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111- - 2000
- [c1]Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
Coauthor Index
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