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"Impact of negative bias temperature instability on the single-event upset ..."
I. El Moukhtari et al. (2013)
- I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu:
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53(9-11): 1325-1328 (2013)
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