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"Reliability Defect Monitoring with Thermal Laser Stimulation: Biased ..."

Felix Beaudoin et al. (2002)

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DOI: 10.1016/S0026-2714(02)00221-4

access: closed

type: Journal Article

metadata version: 2021-01-20

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Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002)

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