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"Electrical modeling of the effect of beam profile for pulsed laser fault ..."

C. Godlewski et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.037

access: closed

type: Journal Article

metadata version: 2020-02-22

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C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart:
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49(9-11): 1143-1147 (2009)

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