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2010 – 2019
- 2010
[j4]Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. Integr. 43(1): 156-165 (2010)- [c8]Duo Li, Sheldon X.-D. Tan, Ning Mi, Yici Cai:
Efficient power grid integrity analysis using on-the-fly error check and reduction. ASP-DAC 2010: 763-768
2000 – 2009
- 2009
- [j3]Ning Mi, Sheldon X.-D. Tan, Boyuan Yan:
Multiple block structure-preserving reduced order modeling of interconnect circuits. Integr. 42(2): 158-168 (2009) - [c7]Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. ASP-DAC 2009: 161-166 - [c6]Thom Jefferson A. Eguia, Ning Mi, Sheldon X.-D. Tan:
Statistical decoupling capacitance allocation by efficient numerical quadrature method. ISQED 2009: 309-316 - 2008
- [j2]Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong:
Fast Variational Analysis of On-Chip Power Grids by Stochastic Extended Krylov Subspace Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(11): 1996-2006 (2008) - [j1]Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong:
Statistical Analysis of On-Chip Power Delivery Networks Considering Lognormal Leakage Current Variations With Spatial Correlation. IEEE Trans. Circuits Syst. I Regul. Pap. 55-I(7): 2064-2075 (2008) - 2007
- [c5]Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong:
Statistical model order reduction for interconnect circuits considering spatial correlations. DATE 2007: 1508-1513 - [c4]Ning Mi, Sheldon X.-D. Tan, Pu Liu, Jian Cui, Yici Cai, Xianlong Hong:
Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks. ICCAD 2007: 48-53 - [c3]Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan:
Voltage drop reduction for on-chip power delivery considering leakage current variations. ICCD 2007: 78-83 - [c2]Ning Mi, Boyuan Yan, Sheldon X.-D. Tan, Jeffrey Fan, Hao Yu:
General Block Structure-Preserving Reduced Order Modeling of Linear Dynamic Circuits. ISQED 2007: 633-638 - 2006
- [c1]Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan:
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation. ICCD 2006: 56-62
Coauthor Index
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