"Statistical modeling and analysis of chip-level leakage power by spectral ..."

Ruijing Shen et al. (2010)

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DOI: 10.1016/J.VLSI.2009.09.003

access: closed

type: Journal Article

metadata version: 2020-02-20

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Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. Integr. 43(1): 156-165 (2010)

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