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2010 – 2019
- 2012
[b2]Ruijing Shen, Sheldon X.-D. Tan, Hao Yu:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. Springer 2012, ISBN 978-1-4614-0787-4, pp. I-XXIX, 1-305- [j5]Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong
:
Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems. ACM Trans. Design Autom. Electr. Syst. 17(4): 51:1-51:19 (2012) - [j4]Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Duo Li, Eduardo H. Pacheco, Murli Tirumala, Lingli Wang:
General Parameterized Thermal Modeling for High-Performance Microprocessor Design. IEEE Trans. Very Large Scale Integr. Syst. 20(2): 211-224 (2012) - [j3]Boyuan Yan, Sheldon X.-D. Tan, Lingfei Zhou, Jie Chen, Ruijing Shen:
Decentralized and Passive Model Order Reduction of Linear Networks With Massive Ports. IEEE Trans. Very Large Scale Integr. Syst. 20(5): 865-877 (2012) - [c8]Ruijing Shen, Sheldon X.-D. Tan, Xuexin Liu:
A new voltage binning technique for yield improvement based on graph theory. ISQED 2012: 243-248 - 2011
- [b1]Ruijing Shen:
Statistical Performance Characterization and Analysis of Nano-Scale VLSI Circuits. University of California, Riverside, USA, 2011 - [c7]Zhigang Hao, Sheldon X.-D. Tan, Ruijing Shen, Guoyong Shi:
Performance bound analysis of analog circuits considering process variations. DAC 2011: 310-315 - [c6]Zhigang Hao, Ruijing Shen, Sheldon X.-D. Tan, Bao Liu, Guoyong Shi, Yici Cai:
Statistical full-chip dynamic power estimation considering spatial correlations. ISQED 2011: 677-682 - 2010
- [j2]Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. Integr. 43(1): 156-165 (2010) - [j1]Ruijing Shen, Sheldon X.-D. Tan, Jian Cui, Wenjian Yu, Yici Cai, Gengsheng Chen:
Variational Capacitance Extraction and Modeling Based on Orthogonal Polynomial Method. IEEE Trans. Very Large Scale Integr. Syst. 18(11): 1556-1566 (2010) - [c5]Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong:
A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlation. DAC 2010: 481-486 - [c4]Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Eduardo H. Pacheco, Murli Tirumala:
General behavioral thermal modeling and characterization for multi-core microprocessor design. DATE 2010: 1136-1141 - [c3]Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong:
A linear statistical analysis for full-chip leakage power with spatial correlation. ACM Great Lakes Symposium on VLSI 2010: 227-232
2000 – 2009
- 2009
- [c2]Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. ASP-DAC 2009: 161-166 - 2008
- [c1]Jian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X.-D. Tan, Wenjian Yu, Jiarong Tong:
Variational capacitance modeling using orthogonal polynomial method. ACM Great Lakes Symposium on VLSI 2008: 23-28
Coauthor Index
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