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ORCIDXrysovalantis Kavousianos
Publications
- 2011
[j13]Xrysovalantis Kavousianos, Vasileios Tenentes
, Krishnendu Chakrabarty, Emmanouil Kalligeros:
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2330-2335 (2011)- 2010
- [j12]Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros:
Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(10): 1640-1644 (2010) - [c29]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes:
Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146 - 2009
- [c24]M. Koutsoupia, Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
LFSR-based test-data compression with self-stoppable seeds. DATE 2009: 1482-1487 - 2008
- [j10]Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos:
Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1333-1338 (2008) - [j9]Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos:
Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains. IEEE Trans. Very Large Scale Integr. Syst. 16(7): 926-931 (2008) - [c23]Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros:
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. DATE 2008: 474-479 - 2007
- [j8]Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos:
Optimal Selective Huffman Coding for Test-Data Compression. IEEE Trans. Computers 56(8): 1146-1152 (2007) - [j7]Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos:
Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(6): 1070-1083 (2007) - 2006
- [c21]Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos:
Efficient test-data compression for IP cores using multilevel Huffman coding. DATE 2006: 1033-1038 - [c20]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
Efficient Multiphase Test Set Embedding for Scan-based Testing. ISQED 2006: 433-438 - 2005
- [c19]George Gekas, Dimitris Nikolos, Emmanouil Kalligeros, Xrysovalantis Kavousianos:
Power aware test-data compression for scan-based testing. ICECS 2005: 1-4 - [c18]Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos:
Reseeding-Based Test Set Embedding with Reduced Test Sequences. ISQED 2005: 226-231 - 2004
- [j6]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
Multiphase BIST: a new reseeding technique for high test-data compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(10): 1429-1446 (2004) - 2003
- [c15]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
A highly regular multi-phase reseeding technique for scan-based BIST. ACM Great Lakes Symposium on VLSI 2003: 295-298 - 2002
- [j5]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos:
On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. J. Electron. Test. 18(3): 315-332 (2002) - [c12]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
A ROMless LFSR Reseeding Scheme for Scan-based BIST. Asian Test Symposium 2002: 206- - [c11]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos:
An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. ISQED 2002: 261-266 - 2001
- [c9]Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos:
A New Reseeding Technique for LFSR-Based Test Pattern Generation. IOLTW 2001: 80-86
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