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ORCIDGiorgio Di Natale
- > Home > Persons > Giorgio Di Natale
Publications
- 2024
[c146]Fabio Pavanello, Cédric Marchand, Paul Jiménez, Xavier Letartre, Ricardo Chaves, Niccolò Marastoni, Alberto Lovato, Mariano Ceccato, George Papadimitriou, Vasileios Karakostas, Dimitris Gizopoulos, Roberta Bardini, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino, Laurence Lerch, Ulrich Rührmair, Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena Ioana Vatajelu:
Security Layers and Related Services within the Horizon Europe NEUROPULS Project. DATE 2024: 1-6- 2023
- [c140]Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores
, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino:
EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. ETS 2023: 1-6 - [i4]Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino:
NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. CoRR abs/2305.03139 (2023) - [i2]Fabio Pavanello, Cédric Marchand, Paul Jiménez, Xavier Letartre, Ricardo Chaves, Niccolò Marastoni, Alberto Lovato, Mariano Ceccato, George Papadimitriou, Vasileios Karakostas, Dimitris Gizopoulos, Roberta Bardini, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino, Laurence Lerch, Ulrich Rührmair, Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena Ioana Vatajelu:
Security layers and related services within the Horizon Europe NEUROPULS project. CoRR abs/2312.09383 (2023) - 2019
- [j38]Alessandro Vallero, Alessandro Savino, Athanasios Chatzidimitriou, Manolis Kaliorakis, Maha Kooli, Marc Riera, Martí Anglada, Giorgio Di Natale, Alberto Bosio, Ramon Canal, Antonio González, Dimitris Gizopoulos, Riccardo Mariani, Stefano Di Carlo:
SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems. IEEE Trans. Computers 68(5): 765-783 (2019) - [c112]Michele Portolan, Alessandro Savino, Régis Leveugle, Stefano Di Carlo, Alberto Bosio, Giorgio Di Natale:
Alternatives to Fault Injections for Early Safety/Security Evaluations. ETS 2019: 1-10 - 2016
- [c85]Alessandro Vallero, Alessandro Savino, Gianfranco Politano, Stefano Di Carlo, Athanasios Chatzidimitriou, Sotiris Tselonis, Manolis Kaliorakis, Dimitris Gizopoulos, Marc Riera, Ramon Canal, Antonio González, Maha Kooli, Alberto Bosio, Giorgio Di Natale:
Cross-layer system reliability assessment framework for hardware faults. ITC 2016: 1-10 - 2015
- [j23]Alessandro Vallero, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Maha Kooli, Alessandro Savino, Gianfranco Politano, Alberto Bosio, Giorgio Di Natale, Dimitris Gizopoulos, Stefano Di Carlo:
Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview. Microprocess. Microsystems 39(8): 1204-1214 (2015) - 2014
- [c67]Stefano Di Carlo, Alessandro Vallero, Dimitris Gizopoulos, Giorgio Di Natale, Arnaud Grasset, Riccardo Mariani, Frank Reichenbach:
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum. DSD 2014: 199-205 - [c59]Stefano Di Carlo, Alessandro Vallero, Dimitris Gizopoulos, Giorgio Di Natale, Antonio González, Ramon Canal, Riccardo Mariani, M. Pipponzi, Arnaud Grasset, Philippe Bonnot, Frank Reichenbach, Gulzaib Rafiq, Trond Loekstad:
Cross-layer early reliability evaluation: Challenges and promises. IOLTS 2014: 228-233 - 2012
- [j9]Alessandro Savino, Stefano Di Carlo, Gianfranco Politano, Alfredo Benso, Alberto Bosio, Giorgio Di Natale:
Statistical Reliability Estimation of Microprocessor-Based Systems. IEEE Trans. Computers 61(11): 1521-1534 (2012) - 2008
- [j6]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008) - [c32]Stefano Di Carlo, Giorgio Di Natale, Riccardo Mariani:
On-Line Instruction-Checking in Pipelined Microprocessors. ATS 2008: 377-382 - 2007
- [j5]Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs. IET Comput. Digit. Tech. 1(3): 237-245 (2007) - [c26]Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 - 2006
- [c24]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Fault Simulator for Static-Linked Faults. ATS 2006: 31-36 - [c23]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
ATPG for Dynamic Burn-In Test in Full-Scan Circuits. ATS 2006: 75-82 - [c22]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263 - [c21]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158 - [c20]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392 - [c19]Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto:
Single-Event Upset Analysis and Protection in High Speed Circuits. ETS 2006: 29-34 - [c18]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A 22n March Test for Realistic Static Linked Faults in SRAMs. ETS 2006: 49-54 - 2005
- [c17]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March tests generation for static and dynamic faults in SRAMs. ETS 2005: 122-127 - [c16]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, March AB1: new March tests for unlinked dynamic memory faults. ITC 2005: 8 - 2003
- [j4]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41(9): 90-97 (2003) - [j3]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Online Self-Repair of FIR Filters. IEEE Des. Test Comput. 20(3): 50-57 (2003) - [c14]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148 - [c13]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160 - [c12]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Data Critically Estimation In Software Applications. ITC 2003: 802-810 - 2002
- [c11]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97 - [c10]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943 - [c9]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508 - 2001
- [c8]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163 - [c7]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303 - [c6]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225 - [c5]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto:
Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8 - 2000
- [c3]Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An effective distributed BIST architecture for RAMs. ETW 2000: 119-124 - [c1]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566
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