default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSanghyeon Baeg
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2024
[c10]Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva:
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. IRPS 2024: 1-7- 2023
- [c9]Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg:
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. IRPS 2023: 1-6 - 2021
- [j29]Muhammad Waqar
, GeunYong Bak, Junhyeong Kwon, Sanghyeon Baeg:
DDR4 Data Channel Failure Due to DC Offset Caused by Intermittent Solder Ball Fracture in FBGA Package. IEEE Access 9: 63002-63011 (2021) - [j28]Kiseok Lee, Jeonghwan Kim, Sanghyeon Baeg:
Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics. IEEE Access 9: 124632-124639 (2021) - [j27]Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen:
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access 9: 137514-137523 (2021)
2010 – 2019
- 2019
- [j26]Ali Ahmed, Kyungbae Park, Saqib Ali Khan, Naeem Maroof, Sanghyeon Baeg:
Architectural design tradeoffs in SRAM-based TCAMs. IEICE Electron. Express 16(13): 20190267 (2019) - 2018
- [j25]Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80: 85-90 (2018) - [j24]Hosung Lee, Sanghyeon Baeg:
Signal characteristic and test exploitation for intermittent nanometer-scale cracks. Microelectron. Reliab. 84: 26-36 (2018) - [j23]Tan Li, Hosung Lee, GeunYong Bak, Sanghyeon Baeg:
Failure signature analysis of power-opens in DDR3 SDRAMs. Microelectron. Reliab. 88-90: 277-281 (2018) - [c8]Donghyuk Yun, Myungsang Park, Chul Seung Lim, Sanghyeon Baeg:
Study of TID effects on one row hammering using gamma in DDR4 SDRAMs. IRPS 2018: 2-1 - 2017
- [j22]Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen:
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. 69: 88-99 (2017) - [j21]Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee:
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69: 100-108 (2017) - [j20]Ali Ahmed, Kyungbae Park, Sanghyeon Baeg:
Resource-Efficient SRAM-Based Ternary Content Addressable Memory. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1583-1587 (2017) - 2016
- [j19]Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13(17): 20160627 (2016) - [j18]Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13(19): 20168001 (2016) - [j17]Kyungbae Park, Chul Seung Lim, Donghyuk Yun, Sanghyeon Baeg:
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology. Microelectron. Reliab. 57: 39-46 (2016) - [j16]Kyungbae Park, Donghyuk Yun, Sanghyeon Baeg:
Statistical distributions of row-hammering induced failures in DDR3 components. Microelectron. Reliab. 67: 143-149 (2016) - 2015
- [c7]GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman:
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS 2015: 3 - 2014
- [j15]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014) - [j14]Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park:
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers 63(8): 2094-2098 (2014) - 2013
- [j13]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37(8-D): 1103-1107 (2013) - 2012
- [j12]Zahid Ullah, Kim Ilgon, Sanghyeon Baeg:
Hybrid Partitioned SRAM-Based Ternary Content Addressable Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(12): 2969-2979 (2012) - [j11]Jongsun Bae, Sanghyeon Baeg, Sungju Park:
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. 61(12): 3259-3272 (2012) - [c6]Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam:
Soft Error Issues with Scaling Technologies. Asian Test Symposium 2012: 68 - 2011
- [j10]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16(4): 45:1-45:10 (2011) - [c5]Pedro Reviriego, Juan Antonio Maestro, Sanghyeon Baeg:
Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors. DAC 2011: 700-705 - [c4]Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED 2011: 390-397 - 2010
- [j9]Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(4): 814-822 (2010)
2000 – 2009
- 2009
- [j8]Sanghyeon Baeg:
Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling. IEEE Trans. Instrum. Meas. 58(8): 2544-2556 (2009) - [j7]Sanghyeon Baeg:
A di/dt Compensation Technique in Delay Testing by Disconnecting Power Pins. IEEE Trans. Instrum. Meas. 58(10): 3450-3456 (2009) - 2008
- [j6]Sanghyeon Baeg:
Low Power Configuration Strategy of TCAM Lookup Table. IEICE Trans. Commun. 91-B(3): 915-917 (2008) - [j5]Sanghyeon Baeg:
Low-Power Ternary Content-Addressable Memory Design Using a Segmented Match Line. IEEE Trans. Circuits Syst. I Regul. Pap. 55-I(6): 1485-1494 (2008) - 2007
- [j4]Sanghyeon Baeg:
Delay Fault Coverage Enhancement by Partial Clocking for Low-Power Designs With Heavily Gated Clocks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(12): 2215-2221 (2007) - 2006
- [j3]Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2605-2608 (2006) - 2005
- [j2]Sanghyeon Baeg, Sung Soo Chung:
Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis. IEEE Trans. Very Large Scale Integr. Syst. 13(3): 370-383 (2005) - 2001
- [c3]Sung Soo Chung, Sanghyeon Baeg:
AC-JTAG: empowering JTAG beyond testing DC nets. ITC 2001: 30-37
1990 – 1999
- 1999
- [j1]Sanghyeon Baeg, William A. Rogers:
A cost-effective design for testability: clock line control and test generation using selective clocking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(6): 850-861 (1999) - 1994
- [c2]Sanghyeon Baeg, William A. Rogers:
A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits. ICCD 1994: 354-358 - [c1]Sanghyeon Baeg, William A. Rogers:
Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. ITC 1994: 340-349
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 22:18 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
