"Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip ..."

Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg (2016)

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DOI: 10.1587/ELEX.13.20168001

access: open

type: Journal Article

metadata version: 2021-02-12

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Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13(19): 20168001 (2016)

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