"A cost-effective design for testability: clock line control and test ..."

Sanghyeon Baeg, William A. Rogers (1999)

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DOI: 10.1109/43.766732

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sanghyeon Baeg, William A. Rogers:
A cost-effective design for testability: clock line control and test generation using selective clocking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(6): 850-861 (1999)

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