Остановите войну!
for scientists:
default search action
Search dblp
Full-text search
- > Home
Please enter a search query
- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal" - exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics" - boolean and: separate words by space
e.g., codd model - boolean or: connect words by pipe symbol (|)
e.g., graph|network
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
Author search results
no matches
Venue search results
no matches
Refine list
refine by author
- no options
- temporarily not available
refine by venue
- no options
- temporarily not available
refine by type
- no options
- temporarily not available
refine by access
- no options
- temporarily not available
refine by year
- no options
- temporarily not available
Publication search results
found 25 matches
- 2021
- Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Sameer Chillarige:
Diagnosis and Yield Learning. ITC-Asia 2021: 1 - Yu Huang, David Francis, Yervant Zorian, Nilanjan Mukherjee:
Automotive Test and Reliability. ITC-Asia 2021: 1 - Wei Hu, Jing Tan, Lingjuan Wu, Yu Tai, Liang Hong:
Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools. ITC-Asia 2021: 1-6 - Shuo Cai, Caicai Xie, Yan Wen, Weizheng Wang:
A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. ITC-Asia 2021: 1-5 - Arjun Chaudhuri, Krishnendu Chakrabarty:
Testing and Fault-Localization Solutions for Monolithic 3D ICs*. ITC-Asia 2021: 1-6 - Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang:
Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. ITC-Asia 2021: 1-6 - Xiaole Cui, Yongliang Chen, Wenqiang Ye, Xiaoxin Cui:
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUF. ITC-Asia 2021: 1-6 - Chang Hao, Zhengfeng Huang, Tianming Ni:
Kelvin Bridge Structure Based TSV Test for Weak Faults. ITC-Asia 2021: 1-6 - Yi-Zhan Hsieh, Hsiao-Yin Tseng, I-Wei Chiu, James Chien-Mo Li:
Fault Modeling and Testing of Spiking Neural Network Chips. ITC-Asia 2021: 1-6 - Yu Huang, Haitao Fu, Bin Deng, Edward Seng, Marc Hutner, Jean-Francois Cote, Geir Eide:
The Advancement of 1149.10. ITC-Asia 2021: 1 - Yi-Hsuan Lee, Shi-Yu Huang:
Rigorous Test Flow for PLL to Identify Weak Devices. ITC-Asia 2021: 1-6 - Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng:
Integrated Scratch Marker for Wafer Defect Diagnosis. ITC-Asia 2021: 1-4 - Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang:
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. ITC-Asia 2021: 1-5 - Xiaoze Lin, Liyang Lai, Huawei Li:
Scalable Parallel Static Learning. ITC-Asia 2021: 1-6 - Chenwei Liu, Jie Ou:
Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency. ITC-Asia 2021: 1-6 - Mitsuo Matsumoto, Masayuki Kawabata, Yukio Kawanabe:
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals. ITC-Asia 2021: 1-6 - John Z.-L. Tang, Dave Y.-W. Lin, Ralf E.-H. Yee, Charles H.-P. Wen:
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening. ITC-Asia 2021: 1-6 - Chen-Lin Tsai, Wei-Hao Chen, Shi-Yu Huang:
A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal. ITC-Asia 2021: 1-6 - Cheng-Di Tsai, Hsiao-Wen Fu, Ting-Yu Chen, Tsung-Chu Huang:
TAIWAN Online: Test AI with AN Codes Online for Automotive Chips. ITC-Asia 2021: 1-6 - Qidong Wang, Aijiao Cui, Gang Qu:
Identification of Counter Registers through Full Scan Chain. ITC-Asia 2021: 1-5 - Zhen Wang, Guofa Zhang, Jing Ye, Jianhui Jiang:
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability. ITC-Asia 2021: 1-6 - Tuanhui Xu, Junlin Huang, Mingen Bu, Zhe Jiang:
An SRAM Test Quality Improvement Method For Automotive chips. ITC-Asia 2021: 1-4 - Aibin Yan, Zijie Zhai, Lele Wang, Jixiang Zhang, Ningning Cui, Tianming Ni, Xiaoqing Wen:
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. ITC-Asia 2021: 1-5 - Han Yang, Zeyu Zhao, Zhikuang Cai:
An optimized DFT technology based on machine learning. ITC-Asia 2021: 1-4 - IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. IEEE 2021, ISBN 978-1-6654-1334-3 [contents]
loading more results
failed to load more results, please try again later
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
retrieved on 2024-06-14 11:53 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint