"An SRAM Test Quality Improvement Method For Automotive chips."

Tuanhui Xu et al. (2021)

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DOI: 10.1109/ITC-ASIA53059.2021.9808542

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type: Conference or Workshop Paper

metadata version: 2022-07-15

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Tuanhui Xu, Junlin Huang, Mingen Bu, Zhe Jiang:
An SRAM Test Quality Improvement Method For Automotive chips. ITC-Asia 2021: 1-4

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