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"Rigorous Test Flow for PLL to Identify Weak Devices."

Yi-Hsuan Lee, Shi-Yu Huang (2021)

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DOI: 10.1109/ITC-ASIA53059.2021.9808590

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-15

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Yi-Hsuan Lee, Shi-Yu Huang:
Rigorous Test Flow for PLL to Identify Weak Devices. ITC-Asia 2021: 1-6

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