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ORCIDKen Chau-Cheung Cheng
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2020 – today
- 2022
[c9]Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang
, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai:
Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. ITC 2022: 549-553- 2021
- [c8]Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu:
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. ETS 2021: 1-2 - [c7]Peter Yi-Yu Liao, Katherine Shu-Min Li, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng, Nova Cheng-Yen Tsai, Leon Chou:
WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. ITC 2021: 309-313 - [c6]Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng:
Integrated Scratch Marker for Wafer Defect Diagnosis. ITC-Asia 2021: 1-4 - 2020
- [c5]Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen:
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. DATE 2020: 1710-1711 - [c4]Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han:
PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. ETS 2020: 1-6 - [c3]Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee:
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. ITC 2020: 1-4 - [c2]Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Sean Y.-S. Chen, Jwu E. Chen, Clark Liu, Andrew Yi-Ann Huang:
Innovative Practice on Wafer Test Innovations. VTS 2020: 1
2010 – 2019
- 2019
- [c1]Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee:
TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning. ITC 2019: 1-6
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