Остановите войну!
for scientists:
default search action
Search dblp
Full-text search
- > Home
Please enter a search query
- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal" - exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics" - boolean and: separate words by space
e.g., codd model - boolean or: connect words by pipe symbol (|)
e.g., graph|network
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
Author search results
no matches
Venue search results
no matches
Refine list
refine by author
- no options
- temporarily not available
refine by venue
- no options
- temporarily not available
refine by type
- no options
- temporarily not available
refine by access
- no options
- temporarily not available
refine by year
- no options
- temporarily not available
Publication search results
found 55 matches
- 2013
- Chin Hai Ang:
Single Test Clock with Programmable Clock Enable Constraints for Multi-clock Domain SoC ATPG Testing. Asian Test Symposium 2013: 195-200 - Bing-Chuan Bai, Chun-Lung Hsu, Ming-Hsueh Wu, Chen-An Chen, Yee-Wen Chen, Kun-Lun Luo, Liang-Chia Cheng, James Chien-Mo Li:
Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM. Asian Test Symposium 2013: 123-127 - Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium 2013: 277-282 - Fang Bao, Mohammad Tehranipoor, Harry H. Chen:
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Asian Test Symposium 2013: 37-42 - Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich:
Securing Access to Reconfigurable Scan Networks. Asian Test Symposium 2013: 295-300 - Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui:
An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium 2013: 227-232 - Debesh Bhatta, Nicholas Tzou, Sen-Wen Hsiao, Abhijit Chatterjee:
Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms Using Bandwidth Interleaving. Asian Test Symposium 2013: 283-288 - Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong:
Multi-histogram ADC BIST System for ADC Linearity Testing. Asian Test Symposium 2013: 213-214 - Chen-An Chen, Yee-Wen Chen, Chun-Lung Hsu, Ming-Hsueh Wu, Kun-Lun Luo, Bing-Chuan Bai, Liang-Chia Cheng:
Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture for 3D Stacked ICs. Asian Test Symposium 2013: 107-108 - Jifeng Chen, Mohammad Tehranipoor:
Critical Paths Selection and Test Cost Reduction Considering Process Variations. Asian Test Symposium 2013: 259-264 - Da Cheng, Hsunwei Hsiung, Bin Liu, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta:
A New March Test for Process-Variation Induced Delay Faults in SRAMs. Asian Test Symposium 2013: 115-122 - Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay:
Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium 2013: 25-30 - Stephan Eggersglüß:
Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill. Asian Test Symposium 2013: 31-36 - Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Accurate Multi-cycle ATPG in Presence of X-Values. Asian Test Symposium 2013: 245-250 - Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue:
A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. Asian Test Symposium 2013: 85-90 - Kelson Gent, Michael S. Hsiao:
Functional Test Generation at the RTL Using Swarm Intelligence and Bounded Model Checking. Asian Test Symposium 2013: 233-238 - Chao Han, Adit D. Singh:
Hazard Initialized LOC Tests for TDF Undetectable CMOS Open Defects. Asian Test Symposium 2013: 189-194 - Masaki Hashizume, Tomoaki Konishi, Hiroyuki Yotsuyanagi, Shyue-Kung Lu:
Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs. Asian Test Symposium 2013: 13-18 - Yingchieh Ho, Katherine Shu-Min Li, Sying-Jyan Wang:
Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator. Asian Test Symposium 2013: 91-96 - Chih-Sheng Hou, Jin-Fu Li:
Testing Disturbance Faults in Various NAND Flash Memories. Asian Test Symposium 2013: 221-226 - Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee:
Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance Parameters. Asian Test Symposium 2013: 50-55 - Tong-Yu Hsieh, Yi-Han Peng, Chia-Chi Ku:
An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance. Asian Test Symposium 2013: 289-294 - Hsunwei Hsiung, Da Cheng, Bin Liu, Ramesh Govindan, Sandeep K. Gupta:
Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. Asian Test Symposium 2013: 251-258 - Shuo-You Hsu, Chih-Hsiang Hsu, Ting-Shuo Hsu, Jing-Jia Liou:
A Region-Based Framework for Design Feature Identification of Systematic Process Variations. Asian Test Symposium 2013: 265-270 - Li-Ren Huang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter:
Mid-bond Interposer Wire Test. Asian Test Symposium 2013: 153-158 - Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian:
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Asian Test Symposium 2013: 177-182 - Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306 - Kentaroh Katoh, Yuta Doi, Satoshi Ito, Haruo Kobayashi, Ensi Li, Nobukazu Takai:
An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators. Asian Test Symposium 2013: 140-146 - Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht:
On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Asian Test Symposium 2013: 201-206 - Hsun-Cheng Lee, Jacob A. Abraham:
Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Asian Test Symposium 2013: 128-133
skipping 25 more matches
loading more results
failed to load more results, please try again later
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
retrieved on 2024-05-27 16:33 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint