"Testing Disturbance Faults in Various NAND Flash Memories."

Chih-Sheng Hou, Jin-Fu Li (2013)

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DOI: 10.1109/ATS.2013.49

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Chih-Sheng Hou, Jin-Fu Li:
Testing Disturbance Faults in Various NAND Flash Memories. Asian Test Symposium 2013: 221-226

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