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Khadija Jirari Stewart , Spyros Tragoudas : Interconnect Testing for Networks on Chips. VTS 2006 : 100-107 export record
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conf/vts/StratigopoulosM06 share record
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Haralampos-G. D. Stratigopoulos , Yiorgos Makris : Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing. VTS 2006 : 406-411 share record
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Vishal Suthar , Shantanu Dutt : Mixed PLB and Interconnect BIST for FPGAs Without Fault-Free Assumptions. VTS 2006 : 36-43 share record
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Rasit Onur Topaloglu : Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations. VTS 2006 : 136-142 share record
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Eric N. Tran , Vishwashanth Kasulasrinivas , Sreejit Chakravarty : Silicon Evaluation of Logic Proximity Bridge Patterns. VTS 2006 : 78-85 share record
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James W. Tschanz : Session Abstract. VTS 2006 : 378-379 share record
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Andreas G. Veneris , Yiorgos Makris : Session Abstract. VTS 2006 : 290-291 share record
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Vishnu C. Vimjam , Michael S. Hsiao : Efficient Fault Collapsing via Generalized Dominance Relations. VTS 2006 : 258-265 share record
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Vlado Vorisek , Bruce Swanson , Kun-Han Tsai , Dhiraj Goswami : Improved Handling of False and Multicycle Paths in ATPG. VTS 2006 : 160-165 share record
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Qi Wang , Mani Soma : RF Front-end System Gain and Linearity Built-in Test. VTS 2006 : 228-233 share record
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Xiaoqing Wen , Seiji Kajihara , Kohei Miyase , Tatsuya Suzuki , Kewal K. Saluja , Laung-Terng Wang , Khader S. Abdel-Hafez , Kozo Kinoshita : A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006 : 58-65 share record
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Cheng-Wen Wu : Session Abstract. VTS 2006 : 128-129 share record
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Forward. VTS 2006 share record
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Organizing Committee. VTS 2006 share record
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Steering Committee. VTS 2006 share record
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Program Committee. VTS 2006 share record
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Reviewers. VTS 2006 share record
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Acknowledgments. VTS 2006 share record
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Test Technology Technical Council (TTTC). VTS 2006 share record
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Test Technology Educational Program (TTEP) Tutorials. VTS 2006 share record
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Awards. VTS 2006 share record
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Zhuo Zhang , Sudhakar M. Reddy , Irith Pomeranz , Xijiang Lin , Janusz Rajski : Scan Tests with Multiple Fault Activation Cycles for Delay Faults. VTS 2006 : 343-348 share record
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Rong Zhang , Zeljko Zilic , Katarzyna Radecka : Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes. VTS 2006 : 186-191 share record
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Quming Zhou , Mihir R. Choudhury , Kartik Mohanram : Design Optimization for Robustness to Single Event Upsets. VTS 2006 : 202-207 share record
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Yervant Zorian , Bruce C. Kim : Session Abstract. VTS 2006 : 334-335 share record
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Yervant Zorian , Dennis Wassung : Session Abstract. VTS 2006 : 154-155 share record
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24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. IEEE Computer Society 2006 , ISBN 0-7695-2514-8 [contents]