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ORCIDNaim Ben-Hamida
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Journal Articles
- 2024
[j12]Hamidreza Mafi
, Naim Ben-Hamida, Sadok Aouini, Yvon Savaria:
Digital Compensation of Timing Skew Mismatches in Time-Interleaved ADCs by Source Separation. IEEE Trans. Instrum. Meas. 73: 1-12 (2024)- 2023
- [j11]Zhe Jiang, Hazem Beshara, Jerry Lam, Naim Ben-Hamida, Calvin Plett:
High Speed DMT for 224 Gb/s and Faster Wireline Transmission. IEEE Trans. Circuits Syst. I Regul. Pap. 70(4): 1758-1771 (2023) - 2022
- [j10]Soheyl Ziabakhsh, Sadok Aouini, Robert G. Gibbins, Matt Mikkelsen, Sanam Moslemi-Tabrizi, Naim Ben-Hamida:
A Memory-Based Direct-Digital Frequency Synthesizer for Fractional Synchronization. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 899-903 (2022) - 2021
- [j9]Jacob Pike, Mahdi Parvizi, David Berton, Naim Ben-Hamida, Sadok Aouini, Calvin Plett:
New Charge-Steering DFEs in 55-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs 68(1): 231-235 (2021) - [j8]Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Soheyl Ziabakhsh, Mahdi Parvizi, Naim Ben-Hamida:
An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1861-1874 (2021) - 2020
- [j7]Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Optimized Periodic ΣΔ Bitstreams for DC Signal Generation Used in Dynamic Calibration Applications. IEEE Open J. Circuits Syst. 1: 3-12 (2020) - [j6]Ahmad Abdo, Sadok Aouini, Naim Ben-Hamida, Claude D'Amours:
Low-Power Built-in Jitter Injection Using Linearized Phase Interpolator. IEEE Trans. Instrum. Meas. 69(9): 6112-6120 (2020) - 2019
- [j5]Ahmad Abdo, Sadok Aouini, Bilal Riaz, Naim Ben-Hamida, Claude D'Amours:
Adaptive Coherent Receiver Settings for Optimum Channel Spacing in Gridless Optical Networks. Future Internet 11(10): 206 (2019) - [j4]Ahmad Abdo, Xueyang Li, Md Samiul Alam, Mahdi Parvizi, Naim Ben-Hamida, Claude D'Amours, David V. Plant:
Partial Pre-Emphasis for Pluggable 400 G Short-Reach Coherent Systems. Future Internet 11(12): 256 (2019) - 2015
- [j3]Samira Bashiri, Sadok Aouini, Naim Ben-Hamida, Calvin Plett:
Analysis and Modeling of the Phase Detector Hysteresis in Bang-Bang PLLs. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(2): 347-355 (2015) - 2001
- [j2]Khaled Saab, Naim Ben-Hamida, Bozena Kaminska:
Closing the gap between analog and digital testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(2): 307-314 (2001) - 1993
- [j1]Naim Ben-Hamida, Bozena Kaminska:
Multiple fault analog circuit testing by sensitivity analysis. J. Electron. Test. 4(4): 331-343 (1993)
Conference and Workshop Papers
- 2024
- [c32]Hamidreza Mafi, Mohamed Amine Bensenouci, Sadok Aouini, Mohammad Honarparvar, Naim Ben-Hamida, Yvon Savaria:
Utilization of Noise-Shaping in Mixed-Signal Timing-Skew Mismatch Calibration of TI-ADCs. ISCAS 2024: 1-5 - [c31]Hamidreza Mafi, Naim Ben-Hamida, Sadok Aouini, Yvon Savaria:
Digital Compensation of Timing-Skew Mismatches in TI-ADCs by Modulation and Source Separation. NewCAS 2024: 104-108 - 2023
- [c30]Hamidreza Mafi, Mohamed Ali, Yvon Savaria, Mohammad Honarparvar, Naim Ben-Hamida:
Background Calibration of Time-Interleaved ADCs with Polyphase Filters. NEWCAS 2023: 1-5 - 2021
- [c29]Ibrahim Alhousseiny, Mohamed Ali, Naim Ben-Hamida, Mohammad Honarparvar, Mohamad Sawan, Yvon Savaria:
Delay-Locked Loop Based Multiphase Clock Generator for Time-Interleaved ADCs. ICECS 2021: 1-4 - 2020
- [c28]Naim Ben-Hamida, Ahmad Abdo, Xueyang Li, Md Samiul Alam, Mahdi Parvizi, Claude D'Amours, David V. Plant:
Study on the Compensation of Silicon Photonics-Based Modulators in DCI Applications. DATE 2020: 1157-1162 - [c27]Tahar Haddad, Naim Ben-Hamida, Sadok Aouini, Jihene Rezgui:
Seizure Prediction with a Single iEEG Electrode Using Non-linear Techniques. ISNCC 2020: 1-6 - [c26]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters. NEWCAS 2020: 299-302 - 2019
- [c25]Yuriy M. Greshishchev, Tingjun Wen, Naim Ben-Hamida, Jorge Aguirre, Sadok Aouini, Marinette Besson, Robert Gibbins, Young Gouk Cho, Jerry Lam, Douglas McPherson, Mahdi Parvizi:
A 60 GS/s 8-b DAC with > 29.5dB SINAD up to Nyquist frequency in 7nm FinFET CMOS. BCICTS 2019: 1-4 - [c24]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
On the Design of DACs for Dynamic Calibration Applications using Periodic Sequences from ΣΔ Modulators. CCECE 2019: 1-4 - [c23]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Selecting the Fastest Settling-Time Filter in PDM-based DACs used for Dynamic Calibration Applications. MWSCAS 2019: 900-903 - 2018
- [c22]A. Kouhoul, Y. Karmous, Naim Benhamida, Sadok Aouini, Tahar Haddad, Larbi Talbi:
Framework for Developping Behavioural Models From Physical Designs. ICM 2018: 132-135 - [c21]Jacob Pike, Mahdi Parvizi, Naim Ben-Hamida, Sadok Aouini, Calvin Plett:
New Charge-Steering Latches in 28nm CMOS for Use in High-Speed Wireline Transceivers. ISCAS 2018: 1-5 - [c20]Luhua Xu, Yun Wang, David Patel, Mohamed H. Morsy-Osman, Rui Li, Michael Hui, Mahdi Parvizi, Naim Ben-Hamida, David V. Plant:
Ultra-Broadband and Ultra-Compact Optical 90° Hybrid Based on 2×4 MMI Coupler with Subwavelength Gratings on Silicon-on-Insulator. OFC 2018: 1-3 - [c19]Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
A coherent subsampling test system arrangement suitable for phase domain measurements. VTS 2018: 1-6 - 2014
- [c18]Tahar Haddad, Larbi Talbi, Ahmed Lakhssassi, Naim Ben-Hamida, Sadok Aouini:
Epilepsy seizure prediction using graph theory. NEWCAS 2014: 293-296 - 2013
- [c17]Sadok Aouini, Jean-Francois Bousquet, Naim Ben-Hamida, Lukas Jakober, John Wolczanski, Christopher Kurowski:
A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution. CICC 2013: 1-4 - 2011
- [c16]Yuriy M. Greshishchev, Daniel Pollex, Shing-Chi Wang, Marinette Besson, Philip Flemeke, Stefan Szilagyi, Jorge Aguirre, Chris Falt, Naim Ben-Hamida, Robert Gibbins, Peter Schvan:
A 56GS/S 6b DAC in 65nm CMOS with 256×6b memory. ISSCC 2011: 194-196 - 2010
- [c15]Yuriy M. Greshishchev, Jorge Aguirre, Marinette Besson, Robert Gibbins, Chris Falt, Philip Flemke, Naim Ben-Hamida, Daniel Pollex, Peter Schvan, Shing-Chi Wang:
A 40GS/s 6b ADC in 65nm CMOS. ISSCC 2010: 390-391 - 2009
- [c14]Naim Ben-Hamida, John Sitch, Philip Flemke, Daniel Pollex, Peter Schvan, Yuriy M. Greshishchev, Shing-Chi Wang, Chris Falt:
Clock recovery for a 40 Gb/s QPSK optical receiver. ICECS 2009: 695-698 - 2008
- [c13]Peter Schvan, Jérôme Bach, Chris Falt, Philip Flemke, Robert Gibbins, Yuriy M. Greshishchev, Naim Ben-Hamida, Daniel Pollex, John Sitch, Shing-Chi Wang, John Wolczanski:
A 24GS/s 6b ADC in 90nm CMOS. ISSCC 2008: 544-545 - 2006
- [c12]Peter Schvan, Daniel Pollex, Shing-Chi Wang, Chris Falt, Naim Ben-Hamida:
A 22GS/s 5b adc in 0.13µm SiGe BiCMOS. ISSCC 2006: 2340-2349 - 2000
- [c11]Khaled Saab, Naim Ben-Hamida, Bozena Kaminska:
Closing the gap between analog and digital. DAC 2000: 774-779 - [c10]Khaled Saab, Naim Ben-Hamida, Bozena Kaminska:
Parametric Fault Simulation and Test Vector Generation. DATE 2000: 650-656 - 1997
- [c9]Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska:
A perturbation based fault modeling and simulation for mixed-signal circuits. Asian Test Symposium 1997: 182-187 - 1996
- [c8]Naim Ben-Hamida, Bechir Ayari, Bozena Kaminska:
Testing of embedded A/D converters in mixed-signal circuit. ICCD 1996: 135-136 - [c7]Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel:
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. ITC 1996: 571-580 - 1995
- [c6]Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska:
Automatic test vector generation for mixed-signal circuits. ED&TC 1995: 458-463 - 1994
- [c5]Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria:
Pseudo-Random Vector Compaction for Sequential Testability. ISCAS 1994: 63-66 - [c4]Naim Ben-Hamida, Bozena Kaminska:
High Level Synthesis with Testability Constraints. ISCAS 1994: 65-68 - [c3]Naim Ben-Hamida, Bozena Kaminska:
Multiple Fault Testing in Analog Circuits. VLSI Design 1994: 61-66 - 1993
- [c2]Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria:
Initiability: A Measure of Sequential Testability. ISCAS 1993: 1619-1622 - [c1]Naim Ben-Hamida, Bozena Kaminska:
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. ITC 1993: 652-661
Coauthor Index
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last updated on 2024-10-02 21:41 CEST by the dblp team
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