"Automatic test vector generation for mixed-signal circuits."

Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska (1995)

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DOI: 10.1109/EDTC.1995.470320

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska:
Automatic test vector generation for mixed-signal circuits. ED&TC 1995: 458-463

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