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Journal Articles
- 2017
[j4]Innocent Agbo
, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017)- 2015
- [j3]Halil Kükner, Pieter Weckx, Sébastien Morrison, Jacopo Franco, Maria Toledano-Luque, Moonju Cho, Praveen Raghavan, Ben Kaczer, Doyoung Jang, Kenichi Miyaguchi, Marie Garcia Bardon, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes. Microprocess. Microsystems 39(8): 1039-1051 (2015) - 2013
- [j2]Halil Kükner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. Microprocess. Microsystems 37(8-A): 792-800 (2013) - 2009
- [j1]Ozgur Tasdizen, Abdulkadir Akin, Halil Kukner, Ilker Hamzaoglu:
Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation. IEEE Trans. Consumer Electron. 55(3): 1645-1653 (2009)
Conference and Workshop Papers
- 2024
- [c17]Subrat Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, A. Sharma, G. Mirabeli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert:
Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation. IRPS 2024: 1-6 - [c16]S. Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, Gioele Mirabelli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, D. Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert:
Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A Comparison Study of Nanosheet FETs (A10) & Complementary FETs (A5). VLSI Technology and Circuits 2024: 1-2 - [c15]Yun Zhou, S. C. Song, Halil Kükner, Giuliano Sisto, Sheng Yang, Anita Farokhnejad, Mohamed Naeim, Moritz Brunion, Ji-Yung Lin, Odysseas Zografos, Pieter Weckx, Shashank Ekbote, Nick Stevens-Yu, David Greenlaw, Steve Molloy, Geert Hellings, Julien Ryckaert:
Backside Power Delivery in High Density and High Performance Context: IR-Drop and Block-Level Power-Performance-Area Benefits. VLSI Technology and Circuits 2024: 1-2 - 2022
- [c14]Halil Kükner, Gökhan Kaplayan, Ahmet Efe, Mehmet Ali Gülden:
RISC-V Processor Trace Encoder with Multiple Instructions Retirement Support. VLSI-SoC 2022: 1-6 - 2015
- [c13]Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser:
The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC 2015: 218-225 - [c12]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS 2015: 1-6 - 2014
- [c11]Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor:
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE 2014: 1-6 - [c10]Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. DSD 2014: 98-107 - [c9]Matthias Hartmann, Halil Kükner, Prashant Agrawal, Praveen Raghavan, Liesbet Van der Perre, Wim Dehaene:
Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories. ACM Great Lakes Symposium on VLSI 2014: 243-244 - [c8]Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology. ISQED 2014: 473-479 - 2013
- [c7]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Bias temperature instability analysis in SRAM decoder. ETS 2013: 1 - [c6]Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. IDT 2013: 1-6 - 2012
- [c5]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
BTI impact on logical gates in nano-scale CMOS technology. DDECS 2012: 348-353 - [c4]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. DFT 2012: 158-163 - [c3]Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. DSD 2012: 1-7 - 2011
- [c2]Ad J. van de Goor, Said Hamdioui, Halil Kukner:
Generic, orthogonal and low-cost March Element based memory BIST. ITC 2011: 1-10 - 2009
- [c1]Ozgur Tasdizen, Halil Kukner, Abdulkadir Akin, Ilker Hamzaoglu:
A high performance reconfigurable Motion Estimation hardware architecture. DATE 2009: 882-885
Coauthor Index
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