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"The defect-centric perspective of device and circuit reliability - From ..."
Ben Kaczer et al. (2015)
- Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken
, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser
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The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC 2015: 218-225
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