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"Degradation analysis of datapath logic subblocks under NBTI aging in ..."

Halil Kukner et al. (2014)

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DOI: 10.1109/ISQED.2014.6783362

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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  - conf/isqed/KuknerKMWRKCPLG14
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  - https://dblp.org/rec/conf/isqed/KuknerKMWRKCPLG14
Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology. ISQED 2014: 473-479

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