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Mauro Ciappa
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2020 – today
- 2021
- [c5]Mauro Ciappa, Marco Pocaterra
:
Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation. IRPS 2021: 1-8 - 2020
- [c4]Mauro Ciappa, Marco Pocaterra
:
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources. IRPS 2020: 1-7
2010 – 2019
- 2018
- [j49]Mauro Ciappa, Paolo Cova, Gaudenzio Meneghesso, Francesco Iannuzzo
:
Editorial. Microelectron. Reliab. 88-90: 1 (2018) - [j48]Mauro Ciappa, Ying Pang, Chenchen Sun:
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectron. Reliab. 88-90: 476-481 (2018) - [j47]Ying Pang, Mauro Ciappa:
Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays. Microelectron. Reliab. 88-90: 992-997 (2018) - 2017
- [j46]Franc Dugal, Mauro Ciappa:
Reliability investigation of the copper-zinc system for solid diffusion bonding in power modules. Microelectron. Reliab. 76-77: 460-464 (2017) - 2016
- [j45]Francesco Iannuzzo
, Mauro Ciappa:
Reliability issues in power electronics. Microelectron. Reliab. 58: 1-2 (2016) - [j44]Hiroshi Suzuki, Mauro Ciappa:
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II. Microelectron. Reliab. 58: 12-16 (2016) - [j43]Takuo Kikuchi, Mauro Ciappa:
Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted tunneling. Microelectron. Reliab. 58: 33-38 (2016) - 2015
- [j42]Mauro Ciappa, Alessandro Blascovich:
Reliability odometer for real-time and in situ lifetime measurement of power devices. Microelectron. Reliab. 55(9-10): 1351-1356 (2015) - [j41]Hiroshi Suzuki, Mauro Ciappa:
TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition. Microelectron. Reliab. 55(9-10): 1976-1980 (2015) - 2014
- [j40]Franc Dugal, Mauro Ciappa:
Study of thermal cycling and temperature aging on PbSnAg die attach solder joints for high power modules. Microelectron. Reliab. 54(9-10): 1856-1861 (2014) - [j39]Mauro Ciappa, Alexey Yu. Illarionov, Emre Ilgünsatiroglu:
Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields. Microelectron. Reliab. 54(9-10): 2081-2087 (2014) - [j38]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov:
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range. Microelectron. Reliab. 54(9-10): 2123-2127 (2014) - [c3]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov, F. Filosomi, C. Santini:
Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy. ESSDERC 2014: 357-360 - 2013
- [j37]Emre Ilgünsatiroglu, Alexey Yu. Illarionov, Mauro Ciappa:
Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications. Microelectron. Reliab. 53(9-11): 1381-1386 (2013) - [j36]Franc Dugal, Mauro Ciappa:
Avoiding misleading artefacts in metallurgical preparation of die attach solder joints in high power modules. Microelectron. Reliab. 53(9-11): 1403-1408 (2013) - [j35]Takuo Kikuchi, Mauro Ciappa:
A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs. Microelectron. Reliab. 53(9-11): 1730-1734 (2013) - 2012
- [j34]Mauro Ciappa, Paolo Cova
, Francesco Iannuzzo
, Gaudenzio Meneghesso
:
Editorial. Microelectron. Reliab. 52(9-10): 1751-1752 (2012) - [j33]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov:
Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies. Microelectron. Reliab. 52(9-10): 2139-2143 (2012) - [j32]Satoshi Ono, Mauro Ciappa, Shigeru Hiura, Wolfgang Fichtner:
Electro-thermal simulation in the time domain of GaN HEMT for RF switch-mode amplifier. Microelectron. Reliab. 52(9-10): 2224-2227 (2012) - 2011
- [j31]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner:
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electron. Test. 27(1): 19-30 (2011) - [j30]Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner:
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. Microelectron. Reliab. 51(9-11): 1479-1483 (2011) - [j29]Aniello Esposito, Mauro Ciappa, Wolfgang Fichtner:
Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes. Microelectron. Reliab. 51(9-11): 1673-1678 (2011) - 2010
- [j28]Mauro Ciappa, Alexander Koschik, Maurizio Dapor
, Wolfgang Fichtner:
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy. Microelectron. Reliab. 50(9-11): 1407-1412 (2010) - [j27]Yuji Sasaki, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner:
Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS. Microelectron. Reliab. 50(9-11): 1621-1625 (2010) - [j26]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner:
A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. Microelectron. Reliab. 50(9-11): 1750-1757 (2010) - [c2]Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. ETS 2010: 170-174
2000 – 2009
- 2009
- [j25]Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner:
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectron. Reliab. 49(9-11): 972-976 (2009) - [j24]Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner:
Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices. Microelectron. Reliab. 49(9-11): 1278-1282 (2009) - [j23]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner:
A new built-in screening methodology to achieve zero defects in the automotive environment. Microelectron. Reliab. 49(9-11): 1334-1340 (2009) - [c1]Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. ETS 2009: 67-72 - 2008
- [j22]Alberto Castellazzi
, Mauro Ciappa:
Novel simulation approach for transient analysis and reliable thermal management of power devices. Microelectron. Reliab. 48(8-9): 1500-1504 (2008) - 2007
- [j21]Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner:
SCR operation mode of diode strings for ESD protection. Microelectron. Reliab. 47(7): 1044-1053 (2007) - [j20]Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi
, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin:
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectron. Reliab. 47(9-11): 1343-1348 (2007) - [j19]Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner:
Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectron. Reliab. 47(9-11): 1707-1712 (2007) - [j18]Alberto Castellazzi
, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet:
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47(9-11): 1713-1718 (2007) - [j17]Jesús Urresti-Ibañez
, Alberto Castellazzi
, M. Piton, José Rebollo
, Michel Mermet-Guyennet, Mauro Ciappa:
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47(9-11): 1725-1729 (2007) - 2006
- [j16]Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner:
Characterization of photonic devices by secondary electron potential contrast. Microelectron. Reliab. 46(9-11): 1536-1541 (2006) - [j15]Alberto Castellazzi
, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet:
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectron. Reliab. 46(9-11): 1754-1759 (2006) - [j14]Davide Barlini, Mauro Ciappa, Alberto Castellazzi
, Michel Mermet-Guyennet, Wolfgang Fichtner:
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectron. Reliab. 46(9-11): 1772-1777 (2006) - 2005
- [j13]Mauro Ciappa:
Lifetime prediction on the base of mission profiles. Microelectron. Reliab. 45(9-11): 1293-1298 (2005) - [j12]Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner:
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectron. Reliab. 45(9-11): 1499-1504 (2005) - [j11]Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. Microelectron. Reliab. 45(9-11): 1532-1537 (2005) - [j10]Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe:
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles. Microelectron. Reliab. 45(9-11): 1694-1699 (2005) - 2004
- [j9]Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner:
2D Dopant Profiling on 4H Silicon Carbide P+N Junction by Scanning Capacitance and Scanning Electron Microscopy. Microelectron. Reliab. 44(9-11): 1681-1686 (2004) - [j8]Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci
, Andrea Scorzoni
:
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques. Microelectron. Reliab. 44(9-11): 1703-1708 (2004) - [j7]Chiara Corvasce, Mauro Ciappa, Davide Barlini, S. Sponton, Gaudenzio Meneghesso
, Wolfgang Fichtner:
Characterization of self-heating effects in semiconductor resistors during transmission line pulses. Microelectron. Reliab. 44(9-11): 1873-1878 (2004) - 2003
- [j6]Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. Microelectron. Reliab. 43(9-11): 1651-1656 (2003) - [j5]Giovanna Mura
, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43(9-11): 1771-1776 (2003) - 2002
- [j4]Mauro Ciappa:
Selected failure mechanisms of modern power modules. Microelectron. Reliab. 42(4-5): 653-667 (2002) - [j3]Mauro Ciappa, Flavio Carbognani, Paolo Cova
, Wolfgang Fichtner:
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. Microelectron. Reliab. 42(9-11): 1653-1658 (2002) - [j2]Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner:
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectron. Reliab. 42(9-11): 1701-1706 (2002) - 2001
- [j1]H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner:
Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications. Microelectron. Reliab. 41(9-10): 1459-1463 (2001)
Coauthor Index
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