"Ensuring the reliability of electron beam crosslinked electric cables by ..."

Mauro Ciappa et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner:
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectron. Reliab. 49(9-11): 972-976 (2009)

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