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ORCIDJihye Kim 0002
Person information
- affiliation: Samsung Electronics, Hwaseoung, South Korea
- affiliation (PhD 2022): Yonsei University, Seoul, South Korea
Other persons with the same name
- Jihye Kim — disambiguation page
- Jihye Kim 0001
![[0000-0003-2953-7883]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0003-2953-7883")
— Kookmin University, Seoul, South Korea (and 1 more) - Jihye Kim 0003 — Seoul National University, Institute of New Media and Communications, Department of Electrical and Computer Engineering, South Korea
- Jihye Kim 0004 — AIGENSciences Inc., Seoul, South Korea (and 1 more)
- Jihye Kim 0005 — North Carolina State University, Bioinformatics Research Center, Raleigh, NC, USA
- Jihye Kim 0006 — Sejong University, Department of Computer and Information Security, Seoul, Korea
- Jihye Kim 0007 — University of Kentucky, Department of Integrated Strategic Communication, Lexington, KY, USA
- Jihye Kim 0008 — ETH Zürich, Switzerland (and 1 more)
2020 – today
- 2023
[j5]Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang:
STRAIT: Self-Test and Self-Recovery for AI Accelerator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3092-3104 (2023)- 2022
- [c6]Jihye Kim, Hayoung Lee, Jongho Park, Sungho Kang:
ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator. ISOCC 2022: 360-361 - 2021
- [j4]Seokjun Jang, Jihye Kim, Sungho Kang:
Reconfigurable Scan Architecture for High Diagnostic Resolution. IEEE Access 9: 120537-120550 (2021) - [j3]Sangjun Lee, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, Sungho Kang:
Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. Sensors 21(18): 6111 (2021) - 2020
- [j2]Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [c5]Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang:
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140
2010 – 2019
- 2019
- [j1]Jihye Kim, Sangjun Lee, Sungho Kang:
Test-Friendly Data-Selectable Self-Gating (DSSG). IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1972-1976 (2019) - [c4]Jihye Kim, Sangjun Lee, Minho Moon, Sungho Kang:
Transition-delay Test Methodology for Designs with Self-gating. ISOCC 2019: 93-94 - [c3]Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. ISOCC 2019: 134-135 - 2014
- [c2]Yu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung:
Test Compression Improvement with EDT Channel Sharing in SoC Designs. NATW 2014: 22-31
2000 – 2009
- 2002
- [c1]Sangmin Bae, DongSup Song, Jihye Kim, Sungho Kang:
An Efficient On-Line Monitoring BIST for Remote Service System. AISA 2002: 205-214
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