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"Test Compression Improvement with EDT Channel Sharing in SoC Designs."

Yu Huang et al. (2014)

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DOI: 10.1109/NATW.2014.14

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-14

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  - https://dblp.org/rec/conf/natw/HuangKJRCHKC14
Yu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung:
Test Compression Improvement with EDT Channel Sharing in SoC Designs. NATW 2014: 22-31

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