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"STRAIT: Self-Test and Self-Recovery for AI Accelerator."

Hayoung Lee et al. (2023)

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DOI: 10.1109/TCAD.2023.3236875

access: closed

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/tcad/LeeKPK23
Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang:
STRAIT: Self-Test and Self-Recovery for AI Accelerator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3092-3104 (2023)

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